Model semiconductor lifetimes from several engineering perspectives. Switch methods, inspect trends, and export calculated outputs. Designed for fast evaluation, reporting, learning, and comparison workflows.
Select a lifetime model, enter engineering values, and compute the minority carrier lifetime. The result appears above this form after submission.
The graph shows exponential minority carrier decay based on the calculated lifetime.
τ = Δn / R
Use this when excess carrier concentration and total recombination rate are known. The result gives the average time carriers survive before recombination.
τ = L² / D
Use this when carrier diffusion length and diffusion coefficient are available. Convert diffusion length into centimeters before applying the equation.
τ = -t / ln(Δn(t) / Δn₀)
Use this for transient decay measurements. The final concentration must be smaller than the initial concentration, and time must be positive.
1/τeff = 1/τbulk + 2S/W
Use this slab approximation when bulk lifetime, surface recombination velocity, and wafer thickness are known. Surface losses shorten the effective lifetime.
These examples show typical calculations using the supported lifetime equations.
| Mode | Input Set | Formula | Lifetime Result |
|---|---|---|---|
| Direct Recombination | Δn = 2.5×10¹³ cm⁻³, R = 5.0×10¹⁸ cm⁻³·s⁻¹ | τ = Δn / R | 5.0 µs |
| Diffusion Length | L = 150 µm, D = 25 cm²/s | τ = L² / D | 9.0 µs |
| Exponential Decay | Δn₀ = 5.0×10¹³ cm⁻³, Δn(t) = 6.7668×10¹² cm⁻³, t = 12 µs | τ = -t / ln(Δn(t)/Δn₀) | 6.0 µs |
| Effective Lifetime | τbulk = 25 µs, S = 120 cm/s, W = 200 µm | 1/τeff = 1/τbulk + 2S/W | 19.23 µs |
It represents the average time an injected minority carrier exists before recombination. Longer lifetime usually supports better diffusion, collection, and device performance in many semiconductor structures.
Use it when you know the excess carrier concentration and the recombination rate directly. It is helpful in analytical studies, simulation post-processing, and simplified engineering checks.
Diffusion coefficient is commonly expressed in cm²/s, so diffusion length should be converted to centimeters. Consistent units are necessary to avoid large scaling errors in lifetime estimates.
The exponential decay formula assumes the carrier population is decreasing with time. If the final value is not lower, the logarithm term becomes invalid for decay-based lifetime extraction.
It combines bulk recombination and two surface losses in a slab approximation. This is useful for wafers, passivation studies, and quick comparisons between surface conditions.
It shows an exponential decay curve based on the calculated lifetime. The graph helps visualize how quickly excess carriers reduce over time for the chosen starting concentration.
Yes. Enter an optional diffusion coefficient in the dedicated field. The calculator then estimates diffusion length using the computed lifetime and reports it with the main results.
They are useful for engineering estimates and educational analysis. Final device decisions should also consider injection level, temperature, Auger effects, SRH details, and measured material behavior.
Important Note: All the Calculators listed in this site are for educational purpose only and we do not guarentee the accuracy of results. Please do consult with other sources as well.